SEMICONDUCTOR TEST SUMMIT - NIWeek 2017

[madison.oshields]

Semiconductor Test Summit

As a smarter, more connected world fuels semiconductor industry growth, test engineers are finding that traditional test equipment (ATE) cannot meet expanding test requirements, which often increases test costs. At the Semiconductor Test Summit, learn how to face this challenge and discover how industry leaders are solving the latest RF and mixed-signal IC test applications with an innovative approach to semiconductor test.

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Are you ready to explore the future of Semiconductor Test?

Check out the sessions below. For more information including abstracts, speakers, and timing, visit our complete catalog.

Tuesday, May 23

Improving the Semiconductor Design To Test Flow

Using a PXI Framework as a USB-PD, I2C, Stimulus-Response Tester

A Modular Method for Automated Semiconductor Product Validation

Achieving Superior RF Performance: The Quest for -50 dB EVM

12-Hour IC Characterization With a PXIe-2738 Matrix Switch Module

How to Create a Behavioral Digital Predistortion Model

Wednesday, May 24

Parametric Test for Next-Generation Semiconductor Technologies

S5 Framework for Automated STS Test Software Generation

Mixed-Signal Instrumentation for 5G System Design and Test

Designing True Hardware-Timed RF Test Systems Using FPGAs

Overcoming the New Test Challenges of 802.11ax

Best Practices for TestStand Semiconductor Module Development

NI STS Maintenance Software: The Key to Maintaining Your STS

View Session Presentations for Semiconductor Test Summit Below!