Modular Data Acquisition
Distributed Measurement and Control
High-Performance Test
Automated Test System Development Software
Perspectives showcases how NI sees what’s next in the world of test and technology.
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Provides support for NI data acquisition and signal conditioning devices.
Provides support for Ethernet, GPIB, serial, USB, and other types of instruments.
Provides support for NI GPIB controllers and NI embedded controllers with GPIB ports.
Make possible that Boolean function accept error cluster as input as this example:
That is a nice little subVI Bob.
You may want to post a VI snippet of the code that is inside the subVI. You might have attached the subVI, but the setup of the Ideas Exchange is horrible and doesn't show file attachments.
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