Hello all !
I am measuring an analog, sin-like, signal with AI on a NI6159.
I do this in 2 ways :
1. measure it without trigger and one chanel in the task, it takes 20ms to get 400 samples.
2. measure it with trigger and 2 channels in the task, trigger on the 1st channel and measure the 2nd channel, it takes 300..330ms to get the same 400 samples.
I take the amplitude and offset out of the sin signal with min/max. With triggering enabled the repeatability of the measurement is 10 times better.
Is this o.k. that the trigger mode takes 300ms/measure ?? There are 21000 sensors on one wafer
and i have to measure the signal 2 times. So this 300ms additional time costs 3.5h on the wafer.
Regards Lutz