Using Labview 8.5 to detect defects in material structure

[HC Tan]

Hi there!

I'm currently new to LabVIEW and am at a loss in using it, together with the hardware available for me, for conducting an ultrasonic non-destructive testing on a piece of material.

Objective:

- To detect defects within a structure.

Hardware on hand:

- NI PXI-5422

- NI PXI-5122

Software on hand: 

- LabVIEW 8.5 

Request Assistance in:

- giving some pointers as to how to start off in the right direction

  (would really appreciate if there some "Print Screen" of the design structure or recommended VIs to use)

Thank You and Best Regards,

HC

[S_Hong]

Hi HC Tan,

For ultrasonic non-destructive testing using our MI products, you can refer to the following resources on our website.

Ultrasonic Test System Resources

Ultrasonic Non-Destructive Testing - Preview Page

Ultrasonic Non-Destructive Testing - Advanced Concepts and Applications

Ultrasonic Non-destructive Testing Starter Kit in LabVIEW

There's a also a nice introductory video which may help you get started.

Ultrasonic Non-Destructive Testing

I hope this helps.

[HC Tan]

Hi S_Hong,

Thank you for your assistance and guidance.

Regards,

HC Tan

[HC Tan]

Hi S_Hong,

Thank you for your earlier assistance. I have come up with the following VI to the best of my current knowledge.

VI's Objective:

- To detect a defect within a specimen.

    - Defect is detected by means a transducer. When transducer detect a defect, there will be a rise in Amplitude of the Response Signal shown in the magnitude graph.

What the VI is showing:

1) A (self-created) input signal is generated into the transducer,

2) A defect within the specimen is detected,

3) Obtain a response signal as a whole

4) Obtain amplitude component (vs freq) of the response signal

Question regarding VI:

- I would like to enquire whether the VI I have created is showing what I would like to see especially in parts 3) and 4). Please kindly note the areas marked by Red Circles.

Am appreciative of your time and effort spent in reviewing the VI.

Thank You and Best Regards,

HC Tan