report summary

[sma]

I have a requirement to provide a list of the failing tests in a report at the top of the report to limit the time required to identify the items which failed.  The default behaviour only reports the first failing test.

The generated report contains over 600 results which when printed cover 22 pages.  The sequence tests 20 identical items with the stimulus being set before the same measurement is taken on each item.

The report is already an enhanced xml report which I created by modifying the default horizontal style report from teststand 3.5.

Can anyone provide insight on how I can search all test results during the report generation process to obtain the failing tests.  Each test in the report is identified by a unique number, the test number is what has to be listed.

[RayFarmer]

Hi,

Try the response back from the following link

http://forums.ni.com/ni/board/message?board.id=330&thread.id=19098&view=by_date_descending&page=2

Regards

Ray Farmer

[sma]

Thanks for the reply, I understand where and how to modify the header to include the results required, I am after information on how to and what to iterate through to obtain the information required to add to the header, eg step name and status pass/fail.

[Anand_Jain]

Sma,

The critical failure stack for xml reports is populated in 'AddReportBody' sequence in ReportGen_xml.seq.

The step 'Call AddCriticalFailureStack' adds the critical failure stack elements to Parameters.UUT.CriticalFailureStack.

To modify the generated critical failure stack, you will need to do the following:

1. Either add a new method to modelsupport2.dll or your own library to add the required items to the critical failure stack
2. Modify 'AddReportBody' sequence in reportgen_xml.seq and to call the new method
3. Depending on the changes you have made to the stylehseet, you might have to also make changes to stylesheet to support the new elements.

Hope this helps

Regards

Anand Jain

National Instruments

Message Edited by Anand Jain on 06-16-2009 11:42 PM

[sma]

Thanks for the information, from your response doe this infer that there is no way to iterate through the test result data maintained by teststand for each test using a dedicated sequence which is then appended to the CriticalFailure data.

Conversely is the dll approach preferred as the time processing time to search the data would be shorter?

[Anand_Jain]

Sma,

You can write a TS sequence to update the critical failure stack but as you correctly stated, it will be faster to do same processing in a code module.

Btw, in TS 4.x, you can use the 'API in expressions' feature to easily write such a sequence. 

 Regards

Anand Jain

National Instruments

[sma]

Unfortunately, the system I need to add this functionality to was developed in TS3.5 and changing to a later version of TS is not an option, so using the newer API functionality is not possible.

The sequence option appears to be the safest as an addition to the appropriate callback will minimise the impact of the changes on the associated design documentation.

Thanks for the information