Need to generate IEEE-1545 parametric data. Does LabVIEW support this?

[sarahk]

Hi, K4LK.

I haven't been able to find too much information on IEEE 1545, so I'm not sure if that's something LabVIEW supports. Can you tell me a little more about what you'd like to do?

Thanks! Have a nice afternoon.

[K4LK]

Thanks for your reply.

My company is into collecting parametric test data.  I have a 70kb PDF document that defines it.  I don't have the time to build my own VI.

[Dennis_Knutson]

Why don't you post the pdf file. I can't find anything specific to 1545 and LabVIEW but you have the ability to create files in just about any format you wish. If you don't have the time, it's probably something that you can contract out. The lack of the number of links to 1545 that Google returned seesm to indicate that it's not widely used. Are you forced to use this specific format or can you use something else for storing parametric data?

[K4LK]

Sorry,

Didn't know you could attach.  See below.

Thanks.

[Dennis_Knutson]

The good news is that it's a text file format so it should be fairly simple to write a program to do this. The bad news is that I can't find any reference to anyone having done it before. The latest standard to be proposed by IEEE for test results is ATML (http://grouper.ieee.org/groups/scc20/tii/). These are some XML schemas for test data exchange and though not yet adopted as far as I know, will probably be around longer and receive greater support. NI's TestStand supports ATML.

[K4LK]

Thank you.  I've got to find the time to write my own VI.