Benchtop Measurement and Test
Distributed Measurement and Control
High-Performance Test
Systems Engineering Software
Perspectives showcases how NI sees what’s next in the world of test and technology.
You can request repair, RMA, schedule calibration, or get technical support. A valid service agreement may be required.
Provides support for NI data acquisition and signal conditioning devices.
Provides support for Ethernet, GPIB, serial, USB, and other types of instruments.
Provides support for NI GPIB controllers and NI embedded controllers with GPIB ports.
12-09-2013 08:10 PM
Is there any module about ICP algorithm or about scan matching in labview?
12-09-2013 07:25 AM
12-10-2013 07:38 AM
I haven't personally seen a scan matching algorithm. However, it is possible to build a library/dll (using something like PCL) and then call the library from LabVIEW.
12-10-2013 08:05 PM
But I am working on a sbRIO which cannot call dll. What is the library you mentioned ? Can the library be used on sbRIO/cRIO?
Thank you.
What do you need our team of experts to assist you with?
Thanks!
We'll be in touch soon!
