Speakers:
Juan Carlos Contreras (Tester OS Group Manager, National Instruments)
Chris Nunn (Product Manager, National Instruments)
Ben Robinson (Product Marketing Manager, National Instruments)
NI has introduced the first ever modular instrument that implements the digital test paradigm and features of semiconductor production testers. This instrument is a monumental improvement in connecting the workflow and data of characterization and production engineers in semiconductor. At this session, learn how NI software and hardware can become your preferred ATE and how the new digital pattern instrument can improve your tests and test data.