Speaker: Luis Elias (Product Manager, National Instruments)
One of today's biggest challenges when building hardware-in-the-loop (HIL) test systems is covering a larger spectrum of applications like automotive radar test. The new embedded software in cars grows more complex and hard to test with every release. At this session, discover how you can achieve the entire spectrum of HIL tests with one platform that combines RF, vision, and ASAM XIL and that features a real-time OS to fulfill your deterministic test requirements and reduce the cost and time of field testing.
