ID: TS3283
Abstract: Discover how to develop an automated test bench to measure with subnanosecond accuracy the timing parameters for STMicroelectronics microcontrollers. By using an NI PXIe-6656 high-speed digital I/O module in a PXI system to simulate digital interfaces patterns, STMicroelectronics engineers synchronized perfectly with the device under test's clock to perform measurements with outstanding precision. They used LabVIEW to develop the main application that drives all the instruments needed to execute their characterization tests such as an air forcing system with a GPIB interface, their PXI source measure unit, and their logic analyzer through its remote client on the local network.
Track/Summit: Automated Test Systems
Speaker(s): Mohamed Marwen Trabelsi, Application Engineer STMicroelectronics
