ID: TS3799
Abstract: Explore the importance of performing unified mixed-signal measurement and characterization procedures and discover how joint analog and digital analysis is relevant for future RF components and devices. First examine an NI PXI-based characterization procedure suitable for mixed-signal systems by analyzing a system in a scattering wave perspective at each port. This allows an RF engineer to integrate innovative mixed-signal models on RF and microwave simulators, such as AWR Microwave Office. Then measure an RF digital-to-analog converter’s linear parameters while using it in the simulator tool.
Track/Summit: Automated Test Systems
Speaker: Pedro Cruz, Postdoc Researcher, IT- University of Aveiro
