Qualcomm Atheros Improves WLAN Test Speed and Coverage Using the NI PXI Vector Signal Transceiver and NI LabVIEW
Author: Doug Johnson, Qualcomm Atheros
Challenge: Keeping wireless local area network (WLAN) test costs low and test accuracy high while reducing characterization times as device complexity grows by tracking an increasing number of wireless standards.
Solution: Using the NI PXI-based vector signal transceiver and the NI LabVIEW FPGA Module to create a customized, flexible WLAN test system that delivers a 200X reduction in test time compared to previous rack-and-stack instruments, resulting in lower test costs and better device characterization.
To vote for this submission for the 2013 GSDAA Community's Choice Award Winner, "Like" this document.Click on the "Like" symbol in the bottom right corner of this window.
To read the entire paper for this submission, download and view the PDF attachment on this document.