Dear Mike,
Thanks for your useful reply. This is Jeff, Robert's supervisor, with some add'l info.
We wish to simulate the response of a detector system (hardware) to a particular set of events. Every ~ 3 milliseconds a pulse of x rays will produce some excited nuclei in a sample. Then, during the time between these pulses we hope to see some gamma rays emitted as these excited nuclei decay. The emission times of any such decays will be pseudo-random, but with an exponentially-decreasing rate with a characteristic time parameter. Prior to doing this experiment, we'd like to simulate this type of event to check the system behavior.
Ideally, we'd like to produce a logic (TTL) pulse with a fixed rate to simulate the x ray pulses. Then we'd like to have another electronic signal produced randomly, but with an exponentially-decreasing probability, after each simulated x-ray pulse. Since we would know the set time characteristics, we would then know if the detection system electronics gave us data that we could interpret as giving the correct time characteristics.
We have many pulse generators (logic and "tail") inthe lab, including one that produces pseudo-random pulses within a gaussian distribution around the set rate. However, this doesn't simulate a decay. A vendor has a pulse generator that can be set to accept "software" triggers, so that it will produce a TTL pulse or pulses every time it receives a so-called "TRG" via USB from a PC. So the question then becomes whether or not we can produce pseudo-random TRG's, with an exponentially-decreasing probability, from the PC and send them to the external pulse generator. I had already calcualted the ~ 8 microsecond/bit and have asked the vendor how many bits are required for the TRG signal. My guess is at least 3. So this means that we could not produce simulated decay pulses more often than about 300 microseconds. Robert mentioned 1 microsecond, but 10 microseconds was really the shortest that we would try to measure. Since that seems infeasible, we might have to do with 300 microseconds. Since the time between x-ray pulses is around 3 milliseconds, we could still produce a simulated decay, just not with as short of a time characteristic as what we will eventually try to measure. It would still be a reasonable system test.
Hope that explains our aims. I look forward to any comments.
Sincerely,
Jeff