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Noise added by digital trigger

I am using a E Series DAQ Device, PCI-6024E with the Sample-and-Hold amplifiers, SC-2040. The system works very well with time-based sampling (scan clock controlled internally). Now my application needs to have scan clock control externally by a shaft encoder, which gives 1024 TTL pulses per revolution. I found that the analogue signals sampled were much noisier than they were using time-based sampling. Therefore I started troubleshooting by unplug all the inputs and ground a channel + and - to ground (AIGND) and measure the noise level. I saw a DC offset of few mV and a rms noise level of 20 mV. The actual level of noise depended on the frequency of the TTL pulses, i.e. the rotational speed of the shaft encoder. However, I found that if
I only shorted the channel + and - but did not connect them to ground, I got virtually no noise, at least within +/- 1 LSB. Any sugguestions are welcome.
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hi, i have not been in touch with DAQ for the last 2 years or so but is they anything to do with Single-ended measurement or Differential Measurement ?

You may wanna check them out.
Ian F
Since LabVIEW 5.1... 7.1.1... 2009, 2010, 2014
依恩与LabVIEW
LVVILIB.blogspot.com
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When PC-6024E is using with SC-2040, PC-6024E has to be configured to take differential measurement. In SC-2040, there is a jumper on each channel to create a DC path for the input bias current if the input is floating. Otherwise, SC-2040 can only take ground- referenced signals.
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You may want to consider posting your question on the Measurement Hardware >> multifunction i/o forum. Those folks do daq more regularly and would be better equiped to help.

Jeremy
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Thank you for your suggestions. I will post my question to multifunction i/o forum.
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