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This example demonstrates performing multiple DMM measurement types (i.e. 2-Wire Resistance and Capacitance) with DMM/Switch Scanning, in series.
This example is in response to the following Example: Configuring the DMM to Take Multiple Measurement Types in the Same Scan List.
That example unfortunately does not work well with some measurement types. Specifically with a capacitance measurement, it takes some time for the DMM to configure properly to take accurate capacitance measurements. We can avoid this problem by having multiple "blocks" of tests. Each block is dedicated to a measurement type. In this example, a top-level VI calls into subsequent blocks (Resistance and Capacitance). Each block opens/closes a new session to the DMM/Switch. Each block performs hardware-timed DMM/Switch Handshaking.
This example could be made more robust by implementing a for loop around the SubVI and passing an array of clusters (the cluster element has all of the SubVI device and channel information).
Steps to Implement or Execute Code
Additional Information or References
Main VI Block Diagram
niSwitch DMM Handshaking C SubVI Front Panel
niSwitch DMM Handshaking C SubVI Block Diagram
**This document has been updated to meet the current required format for the NI Code Exchange.**
Example code from the Example Code Exchange in the NI Community is licensed with the MIT license.