Performance of Single Junction Thermal Voltage Converter (SJTVC)
at 1 MHz via Equivalent Electrical Circuit Simulation
Mamdouh Halawa
National Institute for Standards (NIS), Egypt
Electrical Metrology Department, National Institute for Standards (NIS)
Tersa St., Giza, El-Ahram, Box: 136, Code: 12211, Egypt
Tel: 0020105402742 Fax. 0020233867451 E-mail: mamdouh_halawa@yahoo.com
Abstract
The physical structure of the SJTVC can be represented via simulation using an
equivalent RLC circuit to investigate the performance and estimate the error sources
when using this device as a precise tool for AC voltage and current measurements. This
paper describes instruments and techniques that apply on 0.6 V thermal converters to
achieve this target. The technique was performed, theoretically and practically, to
investigate the frequency-dependence of the SJTVC up to 1 MHz. The LTspice/SwCAD
III simulator was used to analyze the effect of the physical structure of SJTVC in an
effort to better understand the origin of errors at 100 kHz and 1 MHz. The practical
results were firstly measured at National Institute for Standard and Technology (NIST),
US to validate the simulation model at 100 kHz. The model then used to estimate the
AC-DC transfer error of the SJTVC at 1 MHz. Some of the dominated error sources
such as the changes of the real part of the heater impedance, the effect of thermocouple
grounding and the power consumed in the internal resistance of the thermocouple are
estimated at 100 kHz and 1 MHz. The expanded uncertainty assigned to the AC-DC
automated calibration system of NIS is also described.
Keywords
Single Junction Thermal Voltage Converter; AC-DC Transfer Error; Equivalent
Circuit Simulation; Automated Calibration System, Uncertainty analysis.