Hello,
As of now, if there is such a standard, I am unaware of it. However, there may be a way to do something like this using TEDS. The IEEE 1451.4 (TEDS) standard does include an optional calibration section where different types of calibration data can be stored. So you may be able to utilize TEDS to store information about the resistors/capacitors/inductors. However, National Instruments software does not currently read in the calibration information and automatically process it.
Something else that could be considered is that along with the calibration section there is a user data section in TEDS format that allows the placement of ASCII data.
Also, with NI-DAQ 7.2, you have the ability to read in a bitstream from a TEDS sensor. So it is also possibl
e to develop your own format and read in the binary information and process it using LabVIEW. However, you would have to understand IEEE 1451.4, and how to write in the proper checksums, and then create your own TEDS sensor, but I do believe it is possible.
Interesting Idea! Keep them coming!
Justin T.
National Instruments