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RF & Wireless Symposium: 5/24 in San Diego!

National Instruments is hosting a special RF and wireless test event on May 24 in San Diego, CA.

RF engineers from NI will detail best practices and advanced measurement techniques for testing RF and wireless devices. Join us for presentations and discussions on topics ranging from instrumentation considerations to the essential knowledge you need in testing today’s RF and wireless standards.

Register Here:

http://sine.ni.com/nievents/app/offering/p/offeringId/765444/site/nic/country/us/lang/en

Event Details:

Date: May 24

Time: 9:00 a.m. - 5:00 p.m.

Location:

Country Inn & Suites

5975 Lusk Blvd.

San Diego, CA 92121

Agenda:

8:30 - 9:00 a.m.                          Registration and Networking

9:00 - 9:30 a.m.                          Keynote: Realizing the Benefits of Software-Defined RF

   Instrumentation

9:30 - 10:15 a.m.                       Best Practices for Synchronizing Instruments in RFIC Test

10:15 - 10:30 a.m.                     Morning Break

10:30 - 11:15 a.m.                     Advanced RF Signal Analyzer Measurement Techniques

11:15 a.m. - 12:00 p.m.           The Art of Benchmarking Measurement Speed: PXI Versus

                                                           Benchtop Instruments

12:00 - 1:00 p.m.                       Lunch

1:00 - 1:45 p.m.                         Fundamentals of Phase-Coherent Measurement Signals

1:45 - 2:30 p.m.                         Introduction to 3GPP LTE

2:30 - 2:45 p.m.                         Afternoon Break

2:45 - 3:30 p.m.                         Advanced Network Analyzer Measurement Techniques

3:30 - 4:15 p.m.                         Using a Signal Analyzer for Real-Time Signal Processing

                                                           and Recording

4:15 - 4:30 p.m.                         Closing Remarks


Session Descriptions:

Keynote: Realizing the Benefits of Software-Defined RF Instruments
The last decade has seen a growing trend in the RF and wireless test  industry toward modular, software-defined instrumentation. The driving  force behind the adoption of PXI as the standard for automated RF test  largely centers around three benefits: faster measurement speed, broader  instrument flexibility, and lower-cost measurement accuracy. In this  session, get a high-level overview of PXI instruments and share  real-world examples where using PXI has provided engineers with real  benefits.

Advanced RF Signal Analyzer Techniques
Getting every last dB of dynamic range for a particular measurement  often requires careful attention to a number of signal analyzer settings  including reference level, LO power, and IF bandwidth. In this session,  discover some of the fundamental trade-offs between each of these  settings and their impact on both measurement accuracy and  repeatability. In addition, review basic techniques that you can use to  determine whether you are measuring the performance of your DUT or the  instrument itself.

Fundamentals of Phase-Coherent Measurement Signals
RF signal generators and analyzers have traditionally been  single-channel instruments, but applications such as beamforming and  MIMO require multichannel, phase-coherent instrumentation. In this  session, take a detailed look at the architecture of a 4-channel RF  signal analyzer, see how channel-to-channel phase coherence is achieved,  and contrast sharing reference clocks between multiple channels against  sharing LO signals directly. In addition, discover how factors such as  phase noise, input bandwidth, SNR, and other characteristics can affect  the phase coherence between multiple input channels.

Introduction to Testing 3GPP LTE
This session features an overview of the 3GPP LTE physical layer as well  as information on common RF measurements for LTE including transmit  power, adjacent channel power, and error vector magnitude (EVM). This  presentation also offers the best practices for automating LTE  measurements in design validation or production test applications.

Advanced Network Analyzer Measurement Techniques
Vector network analyzers (VNAs) are some of the most complex RF  instruments, but you can use them to perform a wide range of  measurements. In this session, examine basic VNA calibration techniques  as well as more advanced measurement concepts such as time-domain  measurements.

The Art of Benchmarking Measurement Speed: PXI Versus Benchtop Instruments
For engineers automating measurements, speed is everything. However,  quantifying the measurement speed is often difficult, requiring careful  attention to many settings such as averaging, number of symbols, capture  period, and other factors. In this session, explore the fundamental  trade-offs for each of these factors and obtain best practices to  optimize overall test time. In addition, walk through an in-depth  benchmark comparison with a common rack-and-stack instrument to see how  it compares with PXI.

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