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NI solution to measure 10nA@25V to 5mA@2000V

Hi

 

i am looking for NI DAQ solution that is able to measure semiconductor devices with this leakage values Min 10nA@25V to Max 5mA@2000V. Total 700 DUTs at a fixed voltage, 60 seconds total cycle from 1st to 700th DUTs. Cost is a factor. Please advice how I can achieve to measure this leakage range. Thanks

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