NEWS RELEASE – Jan. 25, 2012 – National Instruments today announced early access support for testing next-generation 802.11ac WLAN chipsets and devices. This announcement exemplifies how NI’s modular, software-defined wireless test platform continually expands to address the latest cellular and wireless connectivity standards including 802.11ac.
NI’s 802.11ac WLAN test solution provides flexibility in testing 802.11ac devices in addition to testing 802.11a/b/g/n devices. It works with a wide range of signal bandwidths including 20, 40, 80 and 80+80 160 MHz for both Tx and Rx for up to 4x4 MIMO configurations.
802.11ac Solution Features
NI is working with several early access partners, including silicon suppliers, OEMs and electronic manufacturing services (EMS) providers, to test the latest 802.11ac devices.
NI will be exhibiting the new 802.11ac test solution at Mobile World Congress (hall 2.0, booth 2B93) in Barcelona, Spain, from Feb. 27 through March 3.
To learn more about NI’s 802.11ac test solution, visit www.ni.com/80211ac.