ID: TS3437
Abstract: As the performance of the PXI platform continues to accelerate, the momentum is gathering for PXI-based solutions to disrupt traditional ATE for high-volume semiconductor test. At this session, explore new approaches that leverage PXI to create innovative test solutions that meet overall test goals for both integrated device manufacturers and outsourced semiconductor assembly and test service providers.
Track/Summit: Automated Test Systems
Speaker(s): Heath Noxon, Strategic Account Manager, Semiconductor Segment National Instruments
