Understanding and Measuring Jitter
Track/Summit: Automated Test Systems
Session ID#: TS1580
Abstract: Evolving technology makes it increasingly difficult for system developers to produce and maintain complete, unimpaired signals in digital systems. Putting it succinctly, there are two kinds of designers: those who have signal integrity problems and those that will. This session provides insight into jitter-related digital system challenges and describes their causes, characteristics, effects, and solutions.
Speaker(s): Christian Gindorf, National Instruments
