ID: TS3324
Abstract: Learn how TI develops scalable, system-level solutions for mixed-signal semiconductor test with the NI PXI platform and modular instruments including NI source measure units, oscilloscopes, switches, digital multimeters, and power supplies. Also discover how to incorporate in-house-built system components (such as high-voltage switches) and other instrumentation to augment the PXI system.
Track/Summit: Automated Test Systems
Speaker(s): Michael Burnett, Validation Manager Texas Instruments
Raul Rousselin, Lead Validation Engineer Texas Instruments
