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Past NIWeek Sessions

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AUTOMATED TEST SYSTEMS TRACK - NIWeek 2017 (Presentations Page 1 of 3)

Automated Test Systems Track

This NIWeek, challenge yourself with the Automated Test Systems Track. Learn new ways and best practices to build better test stations by combining NI hardware and software. Unlock tremendous economic value, connect with other professionals, and ultimately find success as you collaborate with industry and product experts on the tools and techniques that help you build more effective modular and automated test systems.


Are you ready to advance your skills in Automated Test?

Check out the session below. For more information including abstracts, speakers, and timing, visit our complete catalog.

 

 

 

Tuesday, May 23

 

Improving the Semiconductor Design To Test Flow

 

 

Hands-On: Introduction to LabVIEW for Instrumentation

 

 

Under the Hood of TestStand Sequence Development

 

 

Designing Test Systems for Large Deployments in Production Environments

 

 

US Army I2WD: Global Measurement Standardization

 

 

From the Experts: Switching and Mass Interconnect Considerations

 

 

Functional Test of ECUs in the Manufacturing Phase

 

 

Hands-On: Build an Automated Test System With TestStand and PXI

 

 

Selection and Economics of Test Fixtures and Test Interconnect

 

 

Automated Test of Automotive MCU Peripheral Driver Software

 

 

 

Wednesday, May 24

 

 

Hands-On: Introduction to LabVIEW for Instrumentation

 

 

Life-Cycle Management Best Practices

 

 

Standardized Hardware-in-the-Loop Test Automation With TestStand

 

 

From the Experts: Planning for System Maintenance

 

 

Personalizing TestStand With Custom Step Types

 

 

5 Disruptive Technologies You Need to Know in Automated Test

 

 

Improve Measurement Accuracy in Your Application

 

 

From The Experts: Security Compliance of Test Systems

 

 

NuvX.IQ - Cloud-Based RF Infotainment Test Platform

 

 

A Dive into NFC Technology and Applications

 

 

Automated Analysis in Test Process Workflow Management Systems

 

 

Hands-On: Build an Automated Test System With TestStand and PXI

 

 

Setting New Standards for the Future of HIL Test Automation

 

 

Simplifying the User Interface in TestStand

 

 

The Evolution of Wireless Power: Trends and Implications

 

 

Using Data From Manufacturing Test Systems

 

 

Avionics Test With LabVIEW for 8 Microsatellites: CYGNSS

 

 

Back to the Basics: Power Supply Test With VirtualBench

 

 

Migrating a Lab From VEE Pro to LabVIEW and TestStand

 

 

 

Thursday, May 25

 

 

From the Designers: Optimize Scope Measurements and Features

 

 

From the Designers: Programming Modular Instruments

 

 

Multichannel RF Systems: Synchronized and Phased Aligned

 

 

Advanced Debugging Techniques for LabVIEW FPGA

 

 

From the Designers: DC Measurement Considerations

 

 

Testing the Tester: Self-Test Methods for Periodic ATE Validation

 

 

From the Designers: DSP in Modern Oscilloscopes

 

 

Lessons Learned: Custom TestStand Plugin Creation

 

 

 

View Session Presentations for Automated Test Systems Track Below!

Please note this is page 1 of 3.

For more presentations, view page 2 and page 3.

Comments
j_dodek
Active Participant
Active Participant
on

Thanks to all speakers

Thanks for releasing the presentations

 

Best Regards from Germany

 

Juergen

--Signature--
Sessions NI-Week 2017 2016
Feedback or kudos are welcome
BenRobinson
Member
Member
on

Functional Test of ECUs in the Manufacturing Phase

Explore a PXI-based functional test framework for electronic engine control units (ECUs) in the manufacturing phase. The main objective is to design a scenario-based function inspection system that tests an ECU with a state-of-the-art PXI system for setup and execution. Learn how KEFICO successfully applied this system to various types of ECUs. 

 

Speaker(s)

Min-Suk Ko Ph.D.  
 Hyundai Kefico - Manager

Won Kyung Ham  
 Hyundai Kefico - Assistant manager

 

 

Session Content

Ben R.
Aerospace & Defense Test
Solutions Marketer
National Instruments
Contributors