Hi JAllent,
1. When these same failures were verified by another organization, was that still in the original chassis in which you observed the resistance failures?
2. Do you see that the resistance measurement varies in all slots of that chassis or just in one?
3. What were the models of the chassis (for both good & bad resistance measurements) that you used?
It'll be important to clarify if the problem follows the card itself, one particular slot, the chassis in any slot, etc.
Hope this helps!
Cheers,
paigec