Jan. 18, 2010 – National Instruments today expanded its automated test product line with two new RF signal conditioning modules that enhance the measurement accuracy and flexibility of PXI-based RF and microwave test systems. In applications such as RF signal path degradation modeling, field strength metering and receiver testing, engineers can combine the new NI PXI-5695 8 GHz programmable RF attenuator with a vector signal generator (VSG) to improve RF signal quality at low power levels. Engineers can integrate the NI PXI-5691 8 GHz programmable RF preamplifier, which also functions as a power amplifier, with VSGs to increase maximum power and with vector signal analyzers (VSAs) to measure low-level signals.
“Accurate control of RF power levels is a critical requirement for us when testing receiver sensitivity,” said Jeff May, test engineer at Itron, a leading provider of intelligent metering and a pioneer of smart grid technology. “The new programmable attenuator from NI gives us the high level of precision we need to accurately control stimulus power levels in our PXI production testers, and this is an important benefit that helps us maintain both efficiency and quality in our test process.”
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