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Looking for a solution for testing high-resolution ADCs

Hello all,

I am looking for a test solution to characterize on the bench a 16 to 20-bit low frequency ADC with a bandwidth of 1 KHz and input differential range of +/- 1 V centered on a common mode between 1.2 V and 2.5 V. My understanding is that this test requires a highly linear ramp signal source to make a very slow triangular ramp, and/or an exceptionally pure low frequency sine wave source, with better accuracy than the ADC under test. Does anyone know what test equipment would be suitable for this purpose?

For instance, is the PCI-4461 suitable for this purpose?

Any experience on running and automating this type of test, please contact me.

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