Feature request: Passing and failing against multiple limits

[MimiKLM]

Hi,

I'd like to return to the idea posted by me on the forum here: http://forums.ni.com/t5/NI-TestStand/Concession/m-p/1458500/highlight/true#M31968

It would be very good if teststand would offer the native testing against multiple limits. Let say the test will pass if the measurement is less than 5 and it pass under concesion when is less than 7, otherwise its fail.

So, summarising TS shall have the ability to delinie not only one set of limits per measurement along with the different kinds of passes.

[WireWeaver]

TestStand supports the following comparison types:

https://zone.ni.com/reference/en-XX/help/370052AA-01/tsref/infotopics/pane_nl_limits/

[TomOrr0W]

@WireWeaver, This idea should probably be listed as declined or new rather than completed.

The request is not to have a more complex expression for determining pass/fail but to have a third state in addition to Pass/Fail (Pass with Concession) where it still passes the overall limits, but fails a set of stricter warning or engineering limits.  The example given requires the measurement to be <5 for an unqualified "Pass", >=7 for an unqualified "Fail", and between 5 and 7 for a qualified "Pass with Concession".  See the thread the OP linked to for more details (and some ways to make it work with TestStand's current result system).

[WireWeaver]

TomOrr0W,

Thanks for pointing that out - i misinterpreted this the first time i read through it.

There are a few workarounds that i think are easy enough. One i haven't seen mentioned here or the other thread is calling the step in a sub sequence with looping configured on the sequence call. You could pretty easily change the limits based off pass/fail.

Similar concepts have been solved in TSM, and could also be solved in a custom plugin:

Grading/Binning: http://zone.ni.com/reference/en-XX/help/373892H-01/tssemiconductor/binning/

PAT: http://zone.ni.com/reference/en-XX/help/373892H-01/tssemiconductor/partaveragetesting/