NI Measurement Studio Idea Exchange

I would like to see the following methods from LabWindows/CVI and Labview added to the Measurement Studio TDMS. The "Create Linear Scaling Info" would be the most useful to me when converting from other data formats to TDMS. I really like being able to keep unscaled data with the scale factors and having the data automatically scaled when reading with TDMS libraries/dlls.

Methods from LabWindows/CVI API

Plotting a big array of sample uses quite some time in the current version. I think this comes from Measurement Studio drawing a line explicitly between each two samples. However, in case of millions of samples, many of those lines will cover only one single pixel.

Instead of drawing all lines, it would be possible to sample the data at a rate where each sample matches just one pixel in the input axis. In order to not loose peaks, the sampling needs to do a min/max calculation and draw two lines for the minima and maxima. A shade could be used between the two curves. When zooming, the sampling needs to be repeated.

This feature would not only save much performance for big data (I think), it can also help to improve clarity of the graph, p.e. in case of noisy signals.

While it's great that Measurement Studio offers all capabilities for us to implement this functionality ourselves, such a feature could be of interest for many users.

Of course, this idea is not my intellectual property. It's a feature already implemented in other products.