We’ve said it before: Smart devices are changing automated testing for the test engineers challenged with ensuring device quality at increasingly lower costs, and for the vendors that serve them. To test smart devices, companies are transitioning from the status quo of rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems that scale with escalating requirements to continually shorten time to market and drive down cost.
Although we enjoy the benefits of the IoT as consumers, as engineers the sheer scale of the IoT can be overwhelming. From testing the smallest integrated circuit (IC) to the fully assembled wireless device, the IoT’s causing a paradigm shift in the test and measurement industry. In semiconductor, the push for smaller/more integrated sensor technology is driving new, lower-cost approaches to mixed-signal test. In consumer electronics, maintaining test coverage in spite of increasing wireless complexity is driving innovative test approaches, like parallel testing. These systems don’t just need to improve upon your status quo of rack-and-stack box instruments or turnkey ATE systems - they need connectivity and problem-solving capability that meets or exceeds the device under test (DUT).
That’s a scary thought if you think about the pace of innovation. Can we rely on our instrument vendors to innovate that fast?
Whether you’re buying or building your next test system, you need a smarter approach to test. That’s why we’ve built an open platform and ecosystem of resources for automated test: because you need to test smart devices with tools that can confidently help lower your cost of test and time to market.