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timeout problem with PCI-6036E

When I use the MAX test panel on a PCI-6036E board in a winXP SP2 PC, everything appears to work fine for a few minutes, then it dies usually with the following error:
 
"Error -200474 occurred at daqmxcfg_DAQmx Read (Analog 1D DBL NChan 1Samp).vi. Possible reason(s): Specified operation did not complete, because the specified timeout expired. Device:  Dev1     Task Name: _unnamedTask<0>."

This isn't a very useful error message for a test panel, as I had not specified a timeout, nor does it say how to fix the problem.

Sometimes it dies with this error instead:

"Error -200329 occurred at daqmxcfg_DAQmx Start Task.vi. Possible reason(s): An error has occurred while attempting to configure the device for an analog input acquisition. If an external master timebase is being used, make sure the source is connected and generating an appropriate clock. Otherwise, contact National Instruments Technical Support. Task Name: _unnamedTask<1>:

This error message is even worse. With the test panel there is no external master timebase.

So here I am NI Tech Support. How do I get this board working please?

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Message 1 of 5
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Hello Dr. Time,

Do you receive an error no matter what mode you specify?  The timeout is a default value in the test panels, it cannot be specified by the user.  The default is usually 10 seconds.  Judging from the first error, it seems somehow your device is not getting the sample clock signal to collect a data point before the timeout expires. 

I recommend resetting the device by right-clicking on it in MAX and choosing reset.  Then, use the DAQ Diagnostic Utility to test the board.  This utility will be able to give us a more specific idea of what could be wrong.

Please try this and let us know the results.

Thanks,

Laura

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Message 2 of 5
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Running the diagnostic results in the following (I'll just show the failed sections):
 
12/21/2005 10:43:31 AM
Selected Device: Dev1
Device Type: PCI-6036E
Serial Number: 10EC6E3
 
Note: The board was not plugged into anything during the diagnostic.
 
Running Calibration ...   FAILED for the following reason: 
Error -200545 occurred at DAQmx Self Calibrate.vi
 
Possible reason(s):
Self-calibration failed.  The self-calibration date has not changed.
Disconnect the device from external signals, as they might introduce noise.  Externally calibrate the device to recalibrate the onboard voltage reference that is used for self-calibration.
 
Testing AI Ground Reference...   (FAIL)
************ Test FAILED for the following reason ************
Analog Input was not within tolerance for ground reference.  Expected to read: 0.000000  Actually read: 0.000847
*******************************************************
 
Testing AI Voltage Reference...   (FAIL)
************ Test FAILED for the following reason ************
Analog Input was not within tolerance for reference voltage.    Expected to read: 5.000000  Actually read: 5.684442
*******************************************************
 
Testing AO Single Point...   (FAIL)
************ Test FAILED for the following reason ************
This test failed to output 9.000000 Volts on Dev1/ao0.  The actual value written was 9.999695.
*******************************************************
 
Testing AO Accuracy...   (FAIL)
************ Test FAILED for the following reason ************
This test failed to generate a voltage waveform with an error of less than 0.076208 Volts on Dev1/ao0.  The actual average error was 0.942772 Volts.
*******************************************************
 
 
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Message 3 of 5
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Diagnostic run after using MAX to reset the same board. These failures to "configure the device" are the way the board has been failing during its measurement application. Does this mean the board itself is bad, or is there a software trick to reconfigure it?
 
- - - - - relevant diagnostic output - - - - -
 
Running Calibration ...   FAILED for the following reason: 
Error -200329 occurred at DAQmx Self Calibrate.vi
Possible reason(s):
An error has occurred while attempting to configure the device for an analog input acquisition.
If an external master timebase is being used, make sure the source is connected and generating an appropriate clock. Otherwise, contact National Instruments Technical Support.
 
Testing AI Ground Reference...   (FAIL)
************ Test FAILED for the following reason ************
Error -200329 occurred at DAQmx Start Task.vi
Possible reason(s):
An error has occurred while attempting to configure the device for an analog input acquisition.
If an external master timebase is being used, make sure the source is connected and generating an appropriate clock. Otherwise, contact National Instruments Technical Support.
 
Testing AI Voltage Reference...   (FAIL)
************ Test FAILED for the following reason ************
Error -200329 occurred at DAQmx Start Task.vi
Possible reason(s):
An error has occurred while attempting to configure the device for an analog input acquisition.
If an external master timebase is being used, make sure the source is connected and generating an appropriate clock. Otherwise, contact National Instruments Technical Support.
 
Testing AI Finite Sample Clock...   (FAIL)
************ Test FAILED for the following reason ************
Error -200329 occurred at DAQmx Control Task.vi
Possible reason(s):
An error has occurred while attempting to configure the device for an analog input acquisition.
If an external master timebase is being used, make sure the source is connected and generating an appropriate clock. Otherwise, contact National Instruments Technical Support.
 
Testing AI Finite Sample Clock Frequency...   (FAIL)
************ Test FAILED for the following reason ************
Error -200329 occurred at DAQmx Start Task.vi
Possible reason(s):
An error has occurred while attempting to configure the device for an analog input acquisition.
If an external master timebase is being used, make sure the source is connected and generating an appropriate clock. Otherwise, contact National Instruments Technical Support.
 
Testing AO Single Point...   (FAIL)
************ Test FAILED for the following reason ************
Error -200329 occurred at DAQmx Read (Analog 1D DBL 1Chan NSamp).vi
Possible reason(s):
An error has occurred while attempting to configure the device for an analog input acquisition.
If an external master timebase is being used, make sure the source is connected and generating an appropriate clock. Otherwise, contact National Instruments Technical Support.
 
Testing AO Accuracy...   (FAIL)
************ Test FAILED for the following reason ************
Error -200329 occurred at DAQmx Start Task.vi
Possible reason(s):
An error has occurred while attempting to configure the device for an analog input acquisition.
If an external master timebase is being used, make sure the source is connected and generating an appropriate clock. Otherwise, contact National Instruments Technical Support.
 
 
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Message 4 of 5
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Hello Dr. Time,

After looking at the results of the diagnostic utility, I recommend sending the device in for repair.  You also could look into using a new M Series device.

Regards,

Laura

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Message 5 of 5
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