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Maps for measurement data header organization

Hello

 

I am currently importing measurement files from parametric analyzer and store them into a cluster array (see attached picture). The cluster has 3 arrays : on 2D string array for header (with wafer ID, die, measurement conditions), one 1D string array for parameters names (IDrain, Vdrain, ISource...) and a 2D array of double for the data itself.

 

I face an issue with this organization, particularly when I have more than 10000 element in the array (10000 different cluster). I need to look for unique elements in the header (ie. if i have wafer A wafer B wafer C wafer A wafer A wafer B, the unique array would be wafer A B C) and it take a lot of time.

 

I think maps could do the trick much better than my cluster ? But I can't figure out how to organize it properly to search inside in an efficient manner... I want for example to be able to look for all entries made for Die 34 and for wafer A, B C and D... Can I do maps of maps ?

 

 

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Hi haha,

 

sounds like you would want to use databases instead of home-grown arrays of clusters…

Best regards,
GerdW


using LV2016/2019/2021 on Win10/11+cRIO, TestStand2016/2019
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I agree, specifically try this database library:

 

https://www.ni.com/en/support/downloads/tools-network/download.sqlite-library.html

 

There are some good demo videos if you've never used them before.

 

Maps are good for "look for the one thing ID'd by this one other thing". Databases are good for "look for all of the things that have property X and property Y is between 4 and 16"

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