Hi,
I'm trying to configure micro-probing setup on TSK UF200 prober for wafer level testing but can't find the GPIB command to enable the ATE driver interface.
The UF_GPIB_COMMANDS_MANUAL.pdf I have does not have any command for it.
I believe TSK uses the term 'Micro-probing' unlike other probers use 'Sub-die'.
I appreciate if some one who is experienced on UF200 can help to find the command to use!
Thanks.
