Instrument Control (GPIB, Serial, VISA, IVI)

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Output delay caused by time constant of SR830 Lock-in Amplifier in A Real Time Resistance Measurement under Scanning Temperature

    I am establishing a system including SR830 to measure graphene electronic transport properties,especially under an ultralow temperature and ultrahigh Tesla. Both the temperature and the magnitic field need sweep. But for SR830, the output delay caused by time constant becomes a barrier to real time measurement, in which the output should following the change of resistance immediately.

    My question: I need a method to eliminate the error of output delay, or the accurate delay time of SR830. I have known that the delay time is about 5 times larger than time constant, but it is not precise.

    Following are two exampe labview VI of SR830 and SR560 that I could sharing with you. 

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Hi, 

Perhaps this post  the SR830 manual will be helpful

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