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Overview The example is to demonstrate how to generate a 2D raster pattern of the analog output within the DAQ hardware
Description: The code is intended to sweep an analog output across a 2D raster pattern. On each tick of the sample clock, we use a counter to measure the number of TTL pulses that occurred during the "pixel" of the Analog Output. This is a technique often used for imaging purposes (e.g. X-ray Photoelectron Spectroscopy). *Note: there is a separate version of the code intended to work with the 621x DAQ devices--they implement the buffered period measurement slightly differently (they automatically discard the first sample). All other M and E series devices should use the standard version of the code.
Steps to Implement or Execute Code:
To implement this example:
1. Set the value of the parameters as needed 2. Run the VI 3. (Optional) Turn on the Highlight Execution to see the flow of the VI
To execute this example:
1. Install the required software. 2. Connect the DAQ hardware that supports the AO features 3. Confirm the connection with the MAX with TestPanel 4. Open the VI and refer the Implement Steps
Requirements Software LabVIEW 2012 or compatible NI-DAQmx 16.0 or compatible
Hardware cDAQ with C series Analog Output Module
**This document has been updated to meet the current required format for the NI Code Exchange.**
Example code from the Example Code Exchange in the NI Community is licensed with the MIT license.