Embedded Systems Conference

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NI in the Press: ESC 2011

Celebrating engineering: EDN names 2010 Innovation Award winners, by EDN Staff, Electronic Design News, May 3, 2011


Creative Embedded and Test Engineering from National Instruments, by Terry Knight, Engineering TV, May 5, 2011

CompactRIO Targets Higher-Volume Applications, by Chuck Murray, Design News, May 5, 2011

Chassis/Controllers Trim CompactRIO System Costs, by Electronic Design staff, Electronic Design, May 5, 2011

RF vector signal analyzer for demanding automated test applications, by Amanda McLeman, Control Engineering, May 6, 2011

NI, Tektronix chart oscilloscope territories, by Rick Nelson, Test & Measurement World, May 9, 2011

ESC 2011 Update, by Jon Titus, ECN, May 13, 2011

National Instruments Lower Cost Hybrid Designs Drive Embedded Innovation, by Bill Wong, Engineering TV, May 13, 2011

ESC 2011: Scope strategies charted at embedded design show, by Test & Measurement World staff, Test & Measurement World, June 1, 2011

NI PXIe-5186 digitizer, by NASA Tech Briefs staff, NASA Tech Briefs, June 1, 2011

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