05-13-2019 06:18 AM
Is it possible to show not only the measured capacîtance value but also the range of uncertaintly of the specific measurement?
05-13-2019 09:00 AM
The 'Uncertainty' of the measurement could be represented in terms of the gain and offset error.
This is shown in the specs for the device as (%of reading + % of range): http://www.ni.com/pdf/manuals/376167b.pdf#page=9
If you wanted to do this programmatically, you could implement a small LUT of the spec, read from the Range property as the reference point (% of Range), have the user implement their expected value (% of Reading), and do a little bit of math on the back end to display a measurement certainty range to the user.
Here's a rough guide on how you could implement the math:
05-13-2019 10:47 AM
Hi ChristophersonJ !
Thanks for your answer. The links were helpful. With that it is possible to calculate the accuracy according to the device specifications.
What I wondered is, if it is possible to extract a value for the accuracy of the specific measured capacitance value from the FFT peak analysis (e.g. the peak width) performed in background.