03-19-2008 08:42 AM
03-19-2008 11:31 AM
Hi Samantha and Ryan,
Thanks a lot for your reply. Yes, both of you are right. The error comes from the generation section because there are Z's in the HWS file. I modified the HWS file so the error disappeared. Now I am investigating whether the Z's come from the VCD file which the HWS file was generated from, or come from the WGL.pat file which the VCD was generated from.
Thanks again!
Jing
03-20-2008 12:49 PM
03-20-2008 01:57 PM
Hi Jason,
We used ModelSIM.
Thanks,
Jing
01-22-2010
02:16 PM
- last edited on
12-29-2025
03:56 PM
by
Content Cleaner
Hey guys,
National Instruments has been working with Test System Strategies Incorporated (TSSI), an NI Alliance Partner to develop a new pattern conversion tool called the TSSI TD-Scan for National Instruments to enable engineers to import WGL and STIL vector formats into PXI. The software coverts digital test vectors from either WGL or STIL to work directly with NI 654x and NI 655x digital devices.
The software tool is available from TSSI and is included as a 30-day evaluation package with NI high-speed digital I/O PXI hardware.
Using TD-Scan with National Instruments High Speed Digital Devices (NI 654x and 655x)
Thanks,
Scott Savage
Semiconductor Market Development Manager - Semiconductor Test
National Instruments