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Currently, DSA devices that use voltage excitation have no method to provide that excitation to a particular device within test panels. The only method to do this would be to create a task in Measurement and Automation Explorer which takes much more time that doing a simple test panels test. This should be a fairly simple addition to the test panels user interface. One could simply have a box to check if they require excitation, and a control to determine the voltage level to provide to the DUT. They currently have this for IEPE devices, and it makes sense that voltage excitation should be the same.

Suggest NI produce an inexpensive (<$100) USB "stick" that has 2 hardware counters on it for optically isolated measurement of encoders, or other high-speed devices. The stick would have a standard connector it for easy wiring of differential encoders with ABZ lines. The device would enable measuring two separate encoders or track two sections of a shaftless drive line that needs to position-follow. One or two DIO lines would be a bonus. This would seem to be a good fit for the industrial machine markets (at the very least). Today you need to buy a multifunction daq for a several hundred dollars if you want two counters.

 

Contact me with any further questions.

 

 

Thank you!

 

Rick Yahn

QuadTech, Inc.

414-566-7938

rick.yahn@quadtechworld.com

 

Some users have expressed that they would be interested in getting a 4 port version of the USB-8502/2 CAN interface device with a metal housing, instead of plastic. 

Currently there are only two options available if you want a C-series card that has ±10V analog inputs with internal excitation voltage. Both of the available options have serious limitations which makes them impractical in dynamic testing environments. 

 

9218: With two input channels, it is impractical for large channel count testing. As an example at our test facility, we may run 60 analog channels which would require 30 of these cards. That would require 4 cRIO chassis' 

9219: With a max sample rate of 100 s/s, it cannot be used in a dynamic environment to accurately record data. 

 

 

 

There are two options that would be very beneficial to dynamic testing:

1) Add more input channels to the 9218 card so that high channel count tests don't need 3+ cRIO's. 

2) Make a new card similar to the 9218 with less capability but more input channels (No bridge, no IEPE, no ±20mA). 

For example:

± 5V, ±10V, ±60V Input Range

± 1V, ± 5V, ± 10V Internal Excitation

Minimum of 4 analog input channels.

Sample Rate 5 Ks/s

 

Does anyone else have a need for a card like this?

Hello

 

I don't know if there is already an "idea exchange" about this, it could be usefull that USB devices or adapter support USB 3.0.

A device isn't recognized through an USB 3.0 port.

 

Thanks !

 

Vincent O.

Despite having dedicated RTD cards on other platforms, this doesn't exist on PXI.  The existing bridge input cards have significantly higher sample rates than needed for typical temperature measurements, and it would be nice to have a more economical drop-in option for RTDs that supported more channels.

I use a PXIe-6363 which a wonderful device.   But it lacks level shifting at the digital I/O.

 

I would recommend that most DAQ multi-io devices support programmable and externally driven level-shifting for digital IOs.   Range for DAC driven level-shift (0.8 - 3.6, 5V),  and support for external input.   It would also be nice if multiple ports are present that some of them allow independent logic levels.  Default level should be 3.3V.    Port configurable pull-up, pull-down and latch-hold.

I rarely have to set up hardware for a new analog measurement and always have to puzzle over the difference between RSE and NRSE modes. I think of the inverting input as the reference, so "Non-Referenced Single-Ended" doesn't make sense to me. And, if I run the AISense line to my remote sensor, isn't that a Referenced Single-Ended measurement?

 

Yesterday, I noticed that at least some on-line documentation now refers to GRSE (Ground Referenced Single-Ended); adding that single letter helps a lot. What about adding another single letter and referring to the other mode as RRSE (Remote Referenced Single-Ended)? One letter could save a lot of people a lot of time.

I would like to see a new line of HW on the lines of the lego NXT brick.

basically something between the sbrio and low end usb daq.

this could be a bare bones arm processor, low to mid end daq (8-32 dio (fpga to make them optional ctrs i2c/spi pwm  or timmed io, a few Ai and AO).  this line is for stand alone robotics or data logging.  lower cost and power and expandablilty than the crio but not requiring a PC (except as a client) like the crio.  This would fill in to the labview everywhere model, and programmed just as the crio with labview RT and FPGA.  The cost of the crio makes it not practical and an overkill for some applications and for the hobbiest/education robotics market, maybe something like the NXT brick but higher end would be nice to see.

Hi Idea Exchange team,

 

VirtualBench App looks great since last update, by the way it could be great to add features like boxed scopes have, like :

  • Channel scale customization : actually, we can only use the "10x", could be nice to be able to use also a custom scaling (equation and unit)
  • Native phase shift measurement : actually we can use cursors to retrieve this data, but will be great if directly displayed
  • Update mode : could be also great to switch between Strip, Scope and Sweep mode like in LabVIEW waveform chart 

Any suggestion welcome !

 

Mathieu,

 

I would like to see more USB switching options. For example, a device similar to the USB-6525, but with 16 solid state relays, not just 8. (Skip the DIO)

I have an application in which I have to digitize a pulse across a shunt resistor.  The common mode voltage can be up around 60VDC.  The digitizing cards I was able to find cannot perform a differential measurement without digitizing both sides of the resistor and then subtracting.  This method causes a lot of error due to the needed voltage ranges.  I have been able to digitize some of these pulses with the PXI-4072 DMM with great success.  However, I can control when those pulses occur and setup trigger lines as needed.  Other pulses I need to digitize will occur whenever the UUT decides to put it out.  What is really needed is a way to trigger the DMM on a measured voltage level.  Just for reference, Agilent's PXI DMMs can do this.  It seems such a shame I haven't found a way to do this with NI's DMM.  As a final thought, some pretrigger data would be needed to properly capture the pulse.  Though, pretrigger data would be nice in any hardware triggered acquisition.

The NI DAQmx read is currently limited to 4 multithreaded tasks due to the fact that it is merely a wrapper for an underlying DLL call.  Significant jitter and performance degredation is experienced (#7339294) as the number of parallel reads is increaced beyond 4. As NI transitions to the PXI platform and away from SCXI and users begin acquiring data from large numbers of PXI devices, this thread limitation limits the flexibility and ultimately performance that can be had with such a versatile platform.

 

NI marketing pictures frequently show PXI chassis fully outfitted with various DAQ input cards, but this limitation limits the practical usability of running large numbers of PXI DAQ devices much more so than the bandwidth limitation of the bus. Also, this limitation is referenced nowhere in any documentation pertaining to PXI DSA, DAQ, or SC series hardware. 

 

DAQmx read should be fully thread safe.

I'm writing a paper on different sensors and how to choose the correct sensor when trying to measure a physical phenomenon.  Customers are going to want to search for boards that provide exciation or allow for external exciation, and I don't yet see that as an option on ni.com/products when narrowing a search of our products.  Does anyone else think this is a good idea?

It matters less to me right now because I am about to change jobs but instead of a frame grabber to connect to cameras, we could use frame grabbers that acquire both Hi-Def and standard-def video. We've found some that usually work but get a bit flaky when we are using two simultaneously. Having robust LabVIEW drivers from NI instead of writing our own would save a lot of time.

Increase the max clock rate of the USB-8451 from 250kHz to at least 400kHz.

There is a variety of connection posibillities (link below), but I really miss one for high channel counts, like a SubD25.

http://sine.ni.com/nips/cds/view/p/lang/de/nid/1721

 

Would be great to support NI USB TC01 Type K in Flexlogger to log the data from the device.

当我使用网络流将数据从CRIO传输到PC时,程序正常运行几秒钟后,它提示我断开与CRIO终端的连接。此时FPGA的采样时间为1 uSec。当我将采样时间增加到大于 1 uSec 时,程序运行良好。也就是说,当程序的采样率低于1MS/S时,程序可以正常运行,当采样率等于1MS/S时,程序就会出错。是不是因为队列和网络流写得太慢了?请帮帮我,谢谢。

QQ图片20220412152952.png

dear

attached picture for universal test machine

it is seemingly that this machine cannot be interfaced to computer 

we need this interface to visualized data

so can you suggest or guide me any DAQ or controller to override such problem

 

 

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