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Would be great to support NI USB TC01 Type K in Flexlogger to log the data from the device.

I would like to see a version of the 4-slot cDAQ-9185, but where the 4 slots are arranged the long way, and the whole thing fits in a 1U slot on a standard 19" rack.

As far as I'm aware there is no current way to export the quadrature conversion clock from an encoder task. It would be great to be able to export that signal to use for other things.

 

For example, you could use this signal to perform an analog acquisition each time your encoder passed a mark, giving you position vs. signal. This would be useful for something like a roughness tester where you drag a stylus across a sample and get roughness vs. position. Or a pressure sensor reading pressure versus crankshaft angle.

当我使用网络流将数据从CRIO传输到PC时,程序正常运行几秒钟后,它提示我断开与CRIO终端的连接。此时FPGA的采样时间为1 uSec。当我将采样时间增加到大于 1 uSec 时,程序运行良好。也就是说,当程序的采样率低于1MS/S时,程序可以正常运行,当采样率等于1MS/S时,程序就会出错。是不是因为队列和网络流写得太慢了?请帮帮我,谢谢。

QQ图片20220412152952.png

dear

attached picture for universal test machine

it is seemingly that this machine cannot be interfaced to computer 

we need this interface to visualized data

so can you suggest or guide me any DAQ or controller to override such problem

 

 

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It would be great if there is c series CAN interface module which doesn't need an external power supply. This makes it easy to use and saves time to set up because we don't have to find or prepare an additional power source.

While using NI USB-6008/6009, I am encountering a strange error which I have failed to find the source of it. As you can see, there are 2 types of outputs. When I comment out one of the outputs, other one works fine. However, when I use them both, it gives me an error as shown below in the picture. What could be the problem?
Error : Invalid data format for digital channel
However, error direct to analog output.Error.JPG

In order to synchronize multiple cDAQ-9189 with a computer running Windows and DAQmx, may it be possible to get a PCIe card which can act as GranMasterClock for TSN networks?

Hello,

 

Some of application needs voltage level of 3.3 V, 2.5 V & 1.8 V. (Low Voltage IC families).

In this case we need to operate digital/counter output at desire voltage level.

It will be good if NI provide it.

Also, with reference to following link,

https://forums.ni.com/t5/Data-Acquisition-Idea-Exchange/0-PWM-duty-cycle-with-DAQmx/idi-p/3819545

PWM output can be set to 0% duty cycle (Idle Low) & 100% duty cycle (Idle High).

 

BR & Stay Healthy

It would be great if NI offered something similar to the PLC world in the form of expandable IP20 I/O slices that don't require a chassis. It could offer the same kind of functionality in the modules that the CompactDAQ line offers, but without the need to lock into a chassis. I've found myself leaning towards using PLC I/O for some projects where the end-state is a bit murky, but the programming gets really awkward when using third-party APIs like PVI.

The interface to the PC could be similar to that of a cDAQ chassis: USB or Ethernet. Given the applications of most slice I/O users, 24 VDC would be the preferred way to power such a system.

NI offers some Oscilloscope Devices (see here) but they come with PCI or USB interface only.

These interfaces are good enough for a laboratory device, but they have some limitations if you want to use it in a custom product.

 

I think that an ethernet interface would be a great improvement (it allows a longer cable and it's much more flexible).

I can't say I've investigated this at all, maybe it's already moving this way; all hardware should have it's own available parameters stored on-board, available to be read back by software, for example on startup. Things like available, valid, ranges in volts, current, frequency, channels etc...

 

It would always be a good idea to read those parameters from hardware by software, instead of relying on model number, manuals, drivers. Then, software could easily adapt to different models of the same main type. Plug in a new hardware and it would announce what it's main capabilities are.

 

My2c

Hi,

I am aware of the previous idea here on a filter for the USB DAQ devices, this time I propose a different solution.

Some cDAQ moduls include an anti-aliasing filter, see a documentation here: http://www.ni.com/product-documentation/54597/en/

In many cases our cDAQ and cRIO system could be the solution to higher frequency (100 kS/s - 1 MS/s) voltage signal acquisition if the signal could be (from LabVIEW) programmatically conditioned prior acquisition. Two main processes are required most: amplification/attenuation and filtering.

I think amplification/attenuation is a trivial processing step, I just mention here a flat frequency and phase transfer requirement in the working range, allowing a bypassing of this stage.

Filtering is a little more challenging. My proposal is a "tunable" anti-aliasing filter, fo the sake of simplicity with one programmable cut-off frequency and fixed roll-off charasteristics. Similarly high pass and band pass filters could be implemented but these are just nice-to-have features. Please note that all filters should be in hardware, e.g. some ASIC before any ADC.

Thanks for your attention

Cheers

Istvan Pinter | Sales Development Engineer, EMEIA

Some users have expressed that they would be interested in getting a 4 port version of the USB-8502/2 CAN interface device with a metal housing, instead of plastic. 

Currently there are only two options available if you want a C-series card that has ±10V analog inputs with internal excitation voltage. Both of the available options have serious limitations which makes them impractical in dynamic testing environments. 

 

9218: With two input channels, it is impractical for large channel count testing. As an example at our test facility, we may run 60 analog channels which would require 30 of these cards. That would require 4 cRIO chassis' 

9219: With a max sample rate of 100 s/s, it cannot be used in a dynamic environment to accurately record data. 

 

 

 

There are two options that would be very beneficial to dynamic testing:

1) Add more input channels to the 9218 card so that high channel count tests don't need 3+ cRIO's. 

2) Make a new card similar to the 9218 with less capability but more input channels (No bridge, no IEPE, no ±20mA). 

For example:

± 5V, ±10V, ±60V Input Range

± 1V, ± 5V, ± 10V Internal Excitation

Minimum of 4 analog input channels.

Sample Rate 5 Ks/s

 

Does anyone else have a need for a card like this?

When a DI change detection task runs, the first sample shows the DI state *after* the first detected change.  There's not a clear way to know what the DI state was just *before* the first detected change, i.e. it's *initial* state.

 

This idea has some overlap with one found here, but this one isn't restricted to usage via DAQmx Events and an Event Structure.  Forum discussions that prompted this suggestion can be seen here and here.

 

The proposal is to provide an addition to the API such that an app programmer can determine both initial state just before the first detected change and final state resulting from each detected change.  The present API provides only the latter.

 

Full state knowledge before and after each change can be used to identify the changed lines.  (Similarly, initial state and change knowledge could be used to identify post-change states.)

 

My preferred approach in the linked discussions is to expose the initial state through a queryable property node.  The original poster preferred to have a distinct task type in which initial state would be the first returned sample.  A couple good workarounds were proposed in those threads by a contributor from NI, but I continue to think direct API support would be appropriate.

 

 

-Kevin P

RSI support of the NI 9361 counter module would allow for use in scan-mode within 9144/5 EtherCAT chassis. I have several use cases for this that mostly would benefit from distributed acquisition and end-user-configurable I/O.

Make the hardware capable of having more than one task tied to the Analog outputs . Each analog output should be capable of having the hardware timing for every analog output, so each output can generate its own separate hardware timed waveform.

 

This is something I had to design for our company's test benches because nothing existed off-the-shelf. (What does exist off-the-shelf is beyond incredibly expensive.) It's a card chassis holding 4 cards with 8 individual (5 amp) relay channels per card. Each relay channel has eight selectable sources or sinks. In our case, we have V+ (from a programmable bench power supply), ground, 4 individual resistive dummy loads each with analog DAQ channel, digital input, and an external header connector. There are four programmable 50 watt resistive dummy loads ranging from 1 ohm to 255 ohms. There are also two analog output channels. All of the switches, power supply, and dummy loads are controlled from a PC serial port (I would use USB now, if I had a chance to re-design it.) The inputs are all fed to a PCI-6221 and a PCI-6514. Again, if I had a chance to re-design it, I would ditch the PCI cards and use an FPGA with several A/D converters and digital opto-isolators. I would also consider getting rid of the mechanical relays and try solid-state relays, although we have not had a relay failure in any of the 292 relays (per chassis) in over ten years of daily use.

 

Something like that, only more widely expandable would be very useful to anyone testing a wide range of devices with different signal connections and high output currents. I would design these myself to sell, if I were more ambitious.