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Customer Success Story: Reducing Radar Component Test Time by 75 Percent and Improving Vehicle Passenger Safety

As vehicles become increasingly autonomous, safety equipment becomes more complex, and consequently, so does test system development.

Challenge: Autoliv Inc. needed an automated tester for a Short Range Radar Digital Signal Processing Board used in passenger vehicles. The tester needed to perform 2 batch process model executions in parallel, controlling 12 UUTs simultaneously in high-volume production.

Results: Averna used NI TestStand and NI PXI products to develop a tester with a shared hardware architecture that allows the customer to exploit the full potential of its test instruments. The solution has reduced UUT testing and loading time by 75 percent, while boosting throughput and ensuring stringent quality standards.

Download the document for the complete customer success story or visit our website for more information at www.averna.com

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