Hello, I would like to have the NI-CAN, NI-XNETsupport integrated into the next version of NI Measurement Studio.
Why this kind of devices only have an old style C Library? Could be more useful to have classes on C++ and .NET
Log charts such as the ones pictured in the screenshot I attached are common in the oil industry. Many oils companies use NI equipment and write LabView and Measurement studio based software. The collected data is often plotted in log charts. It would be nice if NI would consider offering a vertical graph control in both Measurement Studio and the LabView products.
Distributing applications via ClickOnce is a fast and easy way to deploy applications to clients all over. However, a "bootstrapper" (http://digital.ni.com/public.nsf/allkb/148A815DF93
Hi, NI team.
I was adviced to share my idea here ( actually it was something I needed, not idea ).
I have Waveform graph control in my application. There are two axes: vertical and horizontal. The plots I show on the graph have different units by vertical axis, so I decided to show those units as a caption of vertical axis. However I wasn't able to give this caption appropriate view and was forced to use label control. The problem with the caption of vertical axis is that it is oriented vertically and you can only change text direction between top-to-down and down-to-top. What I was looking for is a normal orientation from-left-to-right.
May be someone else will use this feature in future
I would like to see the following methods from LabWindows/CVI and Labview added to the Measurement Studio TDMS. The "Create Linear Scaling Info" would be the most useful to me when converting from other data formats to TDMS. I really like being able to keep unscaled data with the scale factors and having the data automatically scaled when reading with TDMS libraries/dlls.
Methods from LabWindows/CVI API
|Advanced Data Scaling|
|Create Linear Scaling Info||TDMS_CreateLinearScalingInfo|
|Create Polynomial Scaling Info||TDMS_CreatePolynomialScalingInfo|
|Create Thermocouple Scaling Info||TDMS_CreateThermocoupleScalingInfo|
|Create RTD Scaling Info||TDMS_CreateRTDScalingInfo|
|Create Table Scaling Info||TDMS_CreateTableScalingInfo|
|Create Strain Scaling Info||TDMS_CreateStrainGageScalingInfo|
|Create Thermistor Scaling Info||TDMS_CreateThermistorScalingInfo|
|Create Reciprocal Scaling Info||TDMS_CreateReciprocalScalingInfo|
I have a project file using .Net 4 (VS2010, properly update) which I opened in VS2013, upon opening with no warning all NI license.licx lines were removed with no warning whatsover.
This should never happen, if something is going to be changed the user should be informed what is happening, especially if it's going to break a build.
I'd like to take advantage of Windows Presentation Foundation as the user interface for our data acquisition software. I'd like to see WPF graphs, switches, gauges, etc. with the ability to add the controls to XAML, databind, etc.
(Also wondering what happened to the beta version of Visual Studio 2012??)
I'd like to see some of the functionality contained in NI-VISA without having to install VISA on my system, but just set a reference to the library in my project. I'd just like to access devices/instrumentation through the serial port or usb without needing admin rights on every machine the runs the application.
Microsofts serial class has limited functionality. I like the reliability that comes with Visa.
This may or may not be possible, but I'd like to be able to run my .NET program using real time. If this isn't something that NI can do because it involves hardware that isn't supplied or supported by NI, it would be nice to have some information on how it can be done. I recently saw some presentations by people that are able to use some real time kernel to get faster loop rates than I can get in Windows (9 Hz). This is the one major deficiency for Measurement Studio. LabVIEW supports FPGA and real time, and I can completely understand why FPGA may not be possible for .NET projects.
I am often adding the glue code to make it work like LabVIEW. I guess I should make my own custom control but it would be better if there was something I could use off the shelf.
Plotting a big array of sample uses quite some time in the current version. I think this comes from Measurement Studio drawing a line explicitly between each two samples. However, in case of millions of samples, many of those lines will cover only one single pixel.
Instead of drawing all lines, it would be possible to sample the data at a rate where each sample matches just one pixel in the input axis. In order to not loose peaks, the sampling needs to do a min/max calculation and draw two lines for the minima and maxima. A shade could be used between the two curves. When zooming, the sampling needs to be repeated.
This feature would not only save much performance for big data (I think), it can also help to improve clarity of the graph, p.e. in case of noisy signals.
While it's great that Measurement Studio offers all capabilities for us to implement this functionality ourselves, such a feature could be of interest for many users.
Of course, this idea is not my intellectual property. It's a feature already implemented in other products.