Thanks for your reply. My problem is not that simple.I am using NI-SWITCH1.6 and need to continue using it. Can't I just use this VI as sub VI and call it? Here is my problem:
I am building a system to test cables that are open at both ends. A cable can have 4, 6, 8, 10, or 20 wires in it. I wish to test the resistance of each individual wire in a cable and insulation between wires. I have four SCXI 1127 modules with SCXI -1331 in a SCXI 1000 chassis. The switches are controlled by a PCI-4060 DMM.
I have written a VI ( in Labview 6.1, NI-SWITCH 1.6, NI DMM 1.6), which configures DMM for multipoint measurement and SCXI 1127 modules in scanner mode. I connect 1_WIRE_LOW_REF of all SCXI-1331s to a common point, which connects all wires in a cab
le/s under test. So, by using SCXI in scanner mode and generating scanlist, I can measure the resistance of individual wires. I use 1127 in 64 x1 multiplexer mode. This takes care of one requirement.
Now for insulation testing, I keep all wires of cables connected to switch channels and need to connect them in combinations. I can generate the combinations and pass it in a loop to close or open switches. I need help in creating correct paths and route the measurements to DMM.
For example:
Let�s say, we have a four wire cable, I need to test the insulation between them in pairs. There are six possible combinations: 1-2, 1-3, 1-4, 2-3, 2-4, 3-4. Let�s say these wire are connected to ch0, ch32, ch1, ch33 of module 4, the VI may need to close the switches as per the paths required (attached in word document).
I just don't know how can it be done.