Track: RF and Wireless Session Type: Tips and Tricks Abstract: As high-tech devices get smaller and more powerful, RF testing becomes more complex. And increased competition means OEMs and other manufacturers have the additional challenge of shortening cycle times while ensuring comprehensive test coverage. At this session, hear from NI Platinum Alliance Partner Averna how to avoid some common RF device-testing bottlenecks and deliver turnkey test solutions—featuring NI hardware and software, automation, swappable fixtures, and robotics—that solve many client challenges. In industries like consumer devices, automotive, and life sciences, these customers benefited from brand protection, lower overall cost of test, and shorter time to market. Speaker: Joseph Des Rosier, Averna
