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In order to help debug and present measured data, it would be nice to have a plot tool that can display smitch chart plots. It could take in the data as an array or DataTable of imaginary numbers. Added bonus would be to provide methods to convert Impedance to Admittance and to also provide color scale based on a 3rd parameter (for example to plot impedance and gain in the same plot).
Log charts such as the ones pictured in the screenshot I attached are common in the oil industry. Many oils companies use NI equipment and write LabView and Measurement studio based software. The collected data is often plotted in log charts. It would be nice if NI would consider offering a vertical graph control in both Measurement Studio and the LabView products.
I have a project file using .Net 4 (VS2010, properly update) which I opened in VS2013, upon opening with no warning all NI license.licx lines were removed with no warning whatsover.
This should never happen, if something is going to be changed the user should be informed what is happening, especially if it's going to break a build.
Hi, NI team. I was adviced to share my idea here ( actually it was something I needed, not idea :) ). I have Waveform graph control in my application. There are two axes: vertical and horizontal. The plots I show on the graph have different units by vertical axis, so I decided to show those units as a caption of vertical axis. However I wasn't able to give this caption appropriate view and was forced to use label control. The problem with the caption of vertical axis is that it is oriented vertically and you can only change text direction between top-to-down and down-to-top. What I was looking for is a normal orientation from-left-to-right.
May be someone else will use this feature in future :) Regards
Plotting a big array of sample uses quite some time in the current version. I think this comes from Measurement Studio drawing a line explicitly between each two samples. However, in case of millions of samples, many of those lines will cover only one single pixel.
Instead of drawing all lines, it would be possible to sample the data at a rate where each sample matches just one pixel in the input axis. In order to not loose peaks, the sampling needs to do a min/max calculation and draw two lines for the minima and maxima. A shade could be used between the two curves. When zooming, the sampling needs to be repeated.
This feature would not only save much performance for big data (I think), it can also help to improve clarity of the graph, p.e. in case of noisy signals.
While it's great that Measurement Studio offers all capabilities for us to implement this functionality ourselves, such a feature could be of interest for many users.
Of course, this idea is not my intellectual property. It's a feature already implemented in other products.
It would be great to incorporate the STM protocol into Measurement Studio, this would all an STM connection by just dropping the tool into Visual Studio, adding the IP and the Port, then collect data. The idea would be to incorporate Flattening and Unflattening of the data after connection to the STM server in the Labview Realtime. This can make everyones life much easier.
The IntensityGraph is a great control - but unfortunately its usefulness is hampered in the extreme due to performance issues. Basically the IntensityGraph.OnPaint() takes way too many CPU cycles. For a 500x150 intensity plot updating at ~10 Hz, this takes upwards of 30-40% of my PC's total CPU. Anything higher than that and my application becomes unusable due to latency problems. I really need to be able to show 2 or 3 times that much data.
Another user has separately reported an inability to display two 500x256 intensity graphs updating at 5 Hz.
We really need NI to address the severe performance limitations of this important control.