Distributing applications via ClickOnce is a fast and easy way to deploy applications to clients all over. However, a "bootstrapper" (http://digital.ni.com/public.nsf/allkb/148A815DF93
Log charts such as the ones pictured in the screenshot I attached are common in the oil industry. Many oils companies use NI equipment and write LabView and Measurement studio based software. The collected data is often plotted in log charts. It would be nice if NI would consider offering a vertical graph control in both Measurement Studio and the LabView products.
I would like to see the following methods from LabWindows/CVI and Labview added to the Measurement Studio TDMS. The "Create Linear Scaling Info" would be the most useful to me when converting from other data formats to TDMS. I really like being able to keep unscaled data with the scale factors and having the data automatically scaled when reading with TDMS libraries/dlls.
Methods from LabWindows/CVI API
|Advanced Data Scaling|
|Create Linear Scaling Info||TDMS_CreateLinearScalingInfo|
|Create Polynomial Scaling Info||TDMS_CreatePolynomialScalingInfo|
|Create Thermocouple Scaling Info||TDMS_CreateThermocoupleScalingInfo|
|Create RTD Scaling Info||TDMS_CreateRTDScalingInfo|
|Create Table Scaling Info||TDMS_CreateTableScalingInfo|
|Create Strain Scaling Info||TDMS_CreateStrainGageScalingInfo|
|Create Thermistor Scaling Info||TDMS_CreateThermistorScalingInfo|
|Create Reciprocal Scaling Info||TDMS_CreateReciprocalScalingInfo|
Hello, I would like to have the NI-CAN, NI-XNETsupport integrated into the next version of NI Measurement Studio.
Why this kind of devices only have an old style C Library? Could be more useful to have classes on C++ and .NET
I have a project file using .Net 4 (VS2010, properly update) which I opened in VS2013, upon opening with no warning all NI license.licx lines were removed with no warning whatsover.
This should never happen, if something is going to be changed the user should be informed what is happening, especially if it's going to break a build.
Hi, NI team.
I was adviced to share my idea here ( actually it was something I needed, not idea ).
I have Waveform graph control in my application. There are two axes: vertical and horizontal. The plots I show on the graph have different units by vertical axis, so I decided to show those units as a caption of vertical axis. However I wasn't able to give this caption appropriate view and was forced to use label control. The problem with the caption of vertical axis is that it is oriented vertically and you can only change text direction between top-to-down and down-to-top. What I was looking for is a normal orientation from-left-to-right.
May be someone else will use this feature in future
Plotting a big array of sample uses quite some time in the current version. I think this comes from Measurement Studio drawing a line explicitly between each two samples. However, in case of millions of samples, many of those lines will cover only one single pixel.
Instead of drawing all lines, it would be possible to sample the data at a rate where each sample matches just one pixel in the input axis. In order to not loose peaks, the sampling needs to do a min/max calculation and draw two lines for the minima and maxima. A shade could be used between the two curves. When zooming, the sampling needs to be repeated.
This feature would not only save much performance for big data (I think), it can also help to improve clarity of the graph, p.e. in case of noisy signals.
While it's great that Measurement Studio offers all capabilities for us to implement this functionality ourselves, such a feature could be of interest for many users.
Of course, this idea is not my intellectual property. It's a feature already implemented in other products.
I'd like to see some of the functionality contained in NI-VISA without having to install VISA on my system, but just set a reference to the library in my project. I'd just like to access devices/instrumentation through the serial port or usb without needing admin rights on every machine the runs the application.
Microsofts serial class has limited functionality. I like the reliability that comes with Visa.
I'd like to take advantage of Windows Presentation Foundation as the user interface for our data acquisition software. I'd like to see WPF graphs, switches, gauges, etc. with the ability to add the controls to XAML, databind, etc.
(Also wondering what happened to the beta version of Visual Studio 2012??)
The MS grid control and all of the 3rd party vendors grid (WPF) controls data bind to an object that has a property for each column of data for example firstname, last name, age, phone number etc.
Well in Data acq say I had 250 channels I would need to create an object that has 250 properties on it. Doable I guess but what if the customer then decides to just show 200 channels I would need a different object for that.
I would want the Measurment Studio grid to be easy to add arrays of data (V, I, R etc). Then if the customer enables Power I could easily add a 4th column or if they stopped the acquisition have the option to append the new arrays of dat to the end of the existing data.
Show me a WPF grid that can do this with performace of course?
It would be great to incorporate the STM protocol into Measurement Studio, this would all an STM connection by just dropping the tool into Visual Studio, adding the IP and the Port, then collect data. The idea would be to incorporate Flattening and Unflattening of the data after connection to the STM server in the Labview Realtime. This can make everyones life much easier.