2013 GSDAA Finalist: Optimization of Parametric Defect Localization on Integrated Circuits

[Christina.Hadly]

2013 Automated Test Finalist

Optimization of Parametric Defect Localization on Integrated Circuits

Authors: Luc Saury and Sebastien Cany, ST-Ericsson and STMicroelectronics

Challenge: Optimizing our fault-localization tool to address complex failure analysis cases on integrated circuits.

Solution: Improving the performance of our PXI-based tool dedicated to parametric fault localization by setting a “handshake” mode between NI modules and building digital variation maps.

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